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The new thallium(I) strontium(II) thio­phosphate TlSrPS4 is isostructural with TlPbPS4 and exhibits a layered structure. Each layer is composed of [(SrS6)(TlS6)]n zigzag chains, which consist of irregular trigonal prisms centred alternately by Tl and Sr atoms. Adjacent [TlS6] and [SrS6] prisms share common triangular faces to form one-dimensional chains parallel to [001]. These chains are connected along [010] by sharing edges of recta­ngular faces in such a way that the apical edges of the prisms point alternately up and down, forming parallel zigzag layers. The layers are stacked perpendicular to the crystallographic a axis and are held together by [PS4] tetra­hedra.

Supporting information

cif

Crystallographic Information File (CIF) https://doi.org/10.1107/S1600536807025445/br2039sup1.cif
Contains datablocks global, I

hkl

Structure factor file (CIF format) https://doi.org/10.1107/S1600536807025445/br2039Isup2.hkl
Contains datablock I

Key indicators

  • Single-crystal X-ray study
  • T = 293 K
  • Mean [sigma](S-P) = 0.003 Å
  • R factor = 0.033
  • wR factor = 0.084
  • Data-to-parameter ratio = 22.8

checkCIF/PLATON results

No syntax errors found



Alert level G ABSTM02_ALERT_3_G The ratio of expected to reported Tmax/Tmin(RR') is < 0.50 Tmin and Tmax reported: 0.018 0.111 Tmin(prime) and Tmax expected: 0.069 0.153 RR(prime) = 0.349 Please check that your absorption correction is appropriate. PLAT199_ALERT_1_G Check the Reported _cell_measurement_temperature 293 K PLAT200_ALERT_1_G Check the Reported _diffrn_ambient_temperature . 293 K PLAT794_ALERT_5_G Check Predicted Bond Valency for Tl1 (1) 0.94
0 ALERT level A = In general: serious problem 0 ALERT level B = Potentially serious problem 0 ALERT level C = Check and explain 4 ALERT level G = General alerts; check 2 ALERT type 1 CIF construction/syntax error, inconsistent or missing data 0 ALERT type 2 Indicator that the structure model may be wrong or deficient 1 ALERT type 3 Indicator that the structure quality may be low 0 ALERT type 4 Improvement, methodology, query or suggestion 1 ALERT type 5 Informative message, check

Comment top

In our effort to extend the range of quaternary ortho-thiophosphate, AMPS4 (A = K, Rb, Cs, Tl and M: divalent metal) (Belkyal et al., 2005 and 2006a), the new compound TlSrPS4 was obtained. Neither the structure nor the properties of strontium quaternary thiophosphates have been known until now. The title compound crystallizes in the centrosymmetric space group Pnma and is isostructural with TlPbPS4 (Belkyal et al., 2006b) and is closely related to those of the other thallium tetrathiophosphate namely TlEuPS4 (Carrillo-Cabrera et al., 1995) and TlSnPS4 (Becker et al., 1987).

The asymmetric unit of the title compound is plotted on Fig. 1. The structure of TlSrPS4 has a pseudo two-dimensional character. Looking down the c axis (Fig. 2), one can see layers of [(SrS6)(TlS6)]n separated by P5+ cations. These geometric parameters are in agreement with values reported in the literature for TlPbPS4 (Belkyal et al., 2006b) or TlEuPS4 (Carrillo-Cabrera et al., 1995).

The layers are composed of wedge-like irregular trigonal prisms alternately centred by Tl and Sr atoms. Adjacent prisms TlS6 and SrS6 share edges of rectangular faces in such a way that edges of the prisms point alternately up and down forming one-dimensional parallel zigzag chains along [010] (Fig. 3). These zigzag chains are joined together by sharing the triangular faces along [001], in such way that the TlS6 prism of one chain shares triangular face with SrS6 prism of the other chain. Thus, the layers formed are connected by [PS4] tetrahedra along [100]. The P—S bonds, within the [PS4] tetrahedra, are almost equidistant from 2.031 (3) to 2.044 (2) Å. The average of these distances is in good agreement with those found in TlPbPS4 [Belkyal et al., 2006b] or TlEuPS4 (Carrillo-Cabrera et al., 1995). The Tl—S bond lengths found in TlSrPS4 range from 3.268 (1) to 3.397 (3) Å and compare very well with those reported for TlPbPS4 (Belkyal et al., 2006b). Whereas the Sr—S distances (2.984 (3) to 3,095 (2) Å) are smaller than those found in the strontium ternary compound Sr2P2S6 (Hadenfeldt & Hoedel, 1996) (3,058 (2)–3.200 (1) Å). This reduction is the result of the increase in the covalent character of the Sr—S bond in TlSrPS4. The same behavior was observed for the Pb—S distances between TlPbPS4 (Belkyal et al., 2006b) and Pb2P2S6 (Hadenfeldt & Hoedel, 1996)·The average Tl—S and Sr—S distances in TlSrPS4 match well with the sum of the ionic radii (Shannon, 1976).

Related literature top

Background information on related structures can be found in Belkyal, El Azhari, Bensch & Depmeier (2006), Carrillo-Cabrera et al. (1995) and Becker et al. (1987).

For related literature, see: Belkyal et al. (2005); Belkyal, El Azhari, Wu et al. (2006); Hadenfeldt & Hoedel (1996); Horn & Sterzel (1973); Johri et al. (1970); Shannon (1976).

Experimental top

TlSrPS4 was prepared from a stochiometric mixture of P2S5 (99,99%, Alfa), SrS (99,9%, ABCR), S (99,99%, Heraeus) and Tl2S. The latter was prepared by thermal decomposition of Tl2CS3 (Horn & Sterzel, 1973; Johri et al., 1970) in argon atmosphere under reduced pressure at Tmax = 523 K. The reaction mixture was thoroughly mixed in a N2-filled glove box and loaded into a quartz ampoule. After evacuation to 10-3 mbar the ampoule was flame-sealed and placed in a computer controlled furnace. The sample was heated to 1200 K, kept at this temperature for 5 days, cooled to 400 K at a rate of 4.8 °K/h, then turned off the furnace. After washing with ether transparent orange platelets were obtained. The compound is slightly air and moisture sensitive. An EDX analysis indicated the presence of all four elements (Tl, Sr, P, S) in an approximate atomic ratio of 1:1:1:4. The EDX analysis was performed using a Philips ESEM XL 30 scanning electron microscope equipped with an EDAX analyser.

Structure description top

In our effort to extend the range of quaternary ortho-thiophosphate, AMPS4 (A = K, Rb, Cs, Tl and M: divalent metal) (Belkyal et al., 2005 and 2006a), the new compound TlSrPS4 was obtained. Neither the structure nor the properties of strontium quaternary thiophosphates have been known until now. The title compound crystallizes in the centrosymmetric space group Pnma and is isostructural with TlPbPS4 (Belkyal et al., 2006b) and is closely related to those of the other thallium tetrathiophosphate namely TlEuPS4 (Carrillo-Cabrera et al., 1995) and TlSnPS4 (Becker et al., 1987).

The asymmetric unit of the title compound is plotted on Fig. 1. The structure of TlSrPS4 has a pseudo two-dimensional character. Looking down the c axis (Fig. 2), one can see layers of [(SrS6)(TlS6)]n separated by P5+ cations. These geometric parameters are in agreement with values reported in the literature for TlPbPS4 (Belkyal et al., 2006b) or TlEuPS4 (Carrillo-Cabrera et al., 1995).

The layers are composed of wedge-like irregular trigonal prisms alternately centred by Tl and Sr atoms. Adjacent prisms TlS6 and SrS6 share edges of rectangular faces in such a way that edges of the prisms point alternately up and down forming one-dimensional parallel zigzag chains along [010] (Fig. 3). These zigzag chains are joined together by sharing the triangular faces along [001], in such way that the TlS6 prism of one chain shares triangular face with SrS6 prism of the other chain. Thus, the layers formed are connected by [PS4] tetrahedra along [100]. The P—S bonds, within the [PS4] tetrahedra, are almost equidistant from 2.031 (3) to 2.044 (2) Å. The average of these distances is in good agreement with those found in TlPbPS4 [Belkyal et al., 2006b] or TlEuPS4 (Carrillo-Cabrera et al., 1995). The Tl—S bond lengths found in TlSrPS4 range from 3.268 (1) to 3.397 (3) Å and compare very well with those reported for TlPbPS4 (Belkyal et al., 2006b). Whereas the Sr—S distances (2.984 (3) to 3,095 (2) Å) are smaller than those found in the strontium ternary compound Sr2P2S6 (Hadenfeldt & Hoedel, 1996) (3,058 (2)–3.200 (1) Å). This reduction is the result of the increase in the covalent character of the Sr—S bond in TlSrPS4. The same behavior was observed for the Pb—S distances between TlPbPS4 (Belkyal et al., 2006b) and Pb2P2S6 (Hadenfeldt & Hoedel, 1996)·The average Tl—S and Sr—S distances in TlSrPS4 match well with the sum of the ionic radii (Shannon, 1976).

Background information on related structures can be found in Belkyal, El Azhari, Bensch & Depmeier (2006), Carrillo-Cabrera et al. (1995) and Becker et al. (1987).

For related literature, see: Belkyal et al. (2005); Belkyal, El Azhari, Wu et al. (2006); Hadenfeldt & Hoedel (1996); Horn & Sterzel (1973); Johri et al. (1970); Shannon (1976).

Computing details top

Data collection: IPDS (Stoe & Cie, 1998); cell refinement: IPDS; data reduction: IPDS; program(s) used to solve structure: SHELXS97 (Sheldrick, 1997); program(s) used to refine structure: SHELXL97 (Sheldrick, 1997); molecular graphics: ORTEP-3 (Farrugia, 1997) and BS (Version 1.51; Ozawa & Kang, 2004); software used to prepare material for publication: SHELXL97.

Figures top
[Figure 1] Fig. 1. The asymmetric unit of the title compound, with anisotropic displacement parameters drawn at the 50% probability level.
[Figure 2] Fig. 2. Extended structure of TlSrPS4 projected along [001].
[Figure 3] Fig. 3. Projection along [001], showing the puckered layer of condensed chains of SrS6 and TlS6 trigonal prisms.
Thallium strontium tetrathiophosphate top
Crystal data top
TlSrPS4F(000) = 792
Mr = 451.20Dx = 4.198 Mg m3
Orthorhombic, PnmaMo Kα radiation, λ = 0.71073 Å
Hall symbol: -P 2ac 2nCell parameters from 935 reflections
a = 12.2985 (8) Åθ = 2.9–27.9°
b = 6.6003 (6) ŵ = 31.28 mm1
c = 8.7957 (6) ÅT = 293 K
V = 713.98 (9) Å3Platelet, orange
Z = 40.08 × 0.07 × 0.06 mm
Data collection top
Stoe IPDS
diffractometer
935 independent reflections
Radiation source: fine-focus sealed tube780 reflections with I > 2σ(I)
Graphite monochromatorRint = 0.099
φ scansθmax = 27.9°, θmin = 2.9°
Absorption correction: numerical
(X-SHAPE; Stoe & Cie, 1998)
h = 1516
Tmin = 0.018, Tmax = 0.111k = 88
6570 measured reflectionsl = 1111
Refinement top
Refinement on F2Primary atom site location: structure-invariant direct methods
Least-squares matrix: fullSecondary atom site location: difference Fourier map
R[F2 > 2σ(F2)] = 0.033 w = 1/[σ2(Fo2) + (0.0408P)2 + 3.1599P]
where P = (Fo2 + 2Fc2)/3
wR(F2) = 0.084(Δ/σ)max = 0.001
S = 1.03Δρmax = 1.46 e Å3
935 reflectionsΔρmin = 2.30 e Å3
41 parametersExtinction correction: SHELXL97 (Sheldrick, 1997)
0 restraintsExtinction coefficient: 0.0033 (3)
Crystal data top
TlSrPS4V = 713.98 (9) Å3
Mr = 451.20Z = 4
Orthorhombic, PnmaMo Kα radiation
a = 12.2985 (8) ŵ = 31.28 mm1
b = 6.6003 (6) ÅT = 293 K
c = 8.7957 (6) Å0.08 × 0.07 × 0.06 mm
Data collection top
Stoe IPDS
diffractometer
935 independent reflections
Absorption correction: numerical
(X-SHAPE; Stoe & Cie, 1998)
780 reflections with I > 2σ(I)
Tmin = 0.018, Tmax = 0.111Rint = 0.099
6570 measured reflections
Refinement top
R[F2 > 2σ(F2)] = 0.03341 parameters
wR(F2) = 0.0840 restraints
S = 1.03Δρmax = 1.46 e Å3
935 reflectionsΔρmin = 2.30 e Å3
Special details top

Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes.

Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > σ(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger.

Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzUiso*/Ueq
Tl10.3980 (1)0.75000.6257 (1)0.031 (1)
Sr10.6395 (1)0.25000.8923 (1)0.016 (1)
P10.3468 (2)0.25000.8764 (2)0.012 (1)
S10.4445 (2)0.25000.6903 (3)0.020 (1)
S20.4310 (2)0.25001.0761 (2)0.018 (1)
S30.2472 (1)0.0025 (2)0.8659 (2)0.018 (1)
Atomic displacement parameters (Å2) top
U11U22U33U12U13U23
Tl(1)0.035 (1)0.036 (1)0.022 (1)0.0000.003 (1)0.000
Sr(1)0.015 (1)0.021 (1)0.013 (1)0.0000.001 (1)0.000
P(1)0.015 (1)0.008 (1)0.013 (1)0.0000.001 (1)0.000
S(1)0.021 (1)0.026 (1)0.013 (1)0.0000.002 (1)0.000
S(2)0.016 (1)0.027 (1)0.011 (1)0.0000.002 (1)0.000
S(3)0.020 (1)0.010 (1)0.025 (1)0.004 (1)0.007 (1)0.002 (1)
Geometric parameters (Å, º) top
Tl1—Sr1i4.2645 (9)Sr1—Tl1i4.2645 (9)
Sr1—S12.984 (3)P1—S12.031 (3)
Sr1—S23.031 (2)P1—S22.039 (3)
Sr1—S3ii3.0406 (18)P1—S32.044 (2)
Sr1—S3iii3.0406 (18)P1—S3vi2.044 (2)
Sr1—S3iv3.0951 (18)P1—Sr1vii3.476 (2)
Sr1—S3v3.0951 (18)S2—Sr1iii3.4234 (7)
Sr1—S2iii3.4234 (7)S2—Sr1i3.4234 (7)
Sr1—S2i3.4234 (7)S3—Sr1iii3.0406 (18)
Sr1—P1iv3.476 (2)S3—Sr1vii3.0951 (18)
Sr1—P13.603 (2)
S1—Sr1—S268.77 (6)S3iv—Sr1—P1113.53 (5)
S1—Sr1—S3ii141.70 (4)S3v—Sr1—P1113.53 (5)
S2—Sr1—S3ii90.84 (5)S2iii—Sr1—P175.53 (4)
S1—Sr1—S3iii141.70 (4)S2i—Sr1—P175.53 (4)
S2—Sr1—S3iii90.84 (5)P1iv—Sr1—P1134.94 (4)
S3ii—Sr1—S3iii66.47 (6)S1—Sr1—Tl1i120.33 (5)
S1—Sr1—S3iv84.67 (5)S2—Sr1—Tl1i51.57 (4)
S2—Sr1—S3iv138.88 (4)S3ii—Sr1—Tl1i49.76 (4)
S3ii—Sr1—S3iv127.32 (3)S3iii—Sr1—Tl1i49.76 (4)
S3iii—Sr1—S3iv91.588 (16)S3iv—Sr1—Tl1i140.86 (4)
S1—Sr1—S3v84.67 (5)S3v—Sr1—Tl1i140.86 (4)
S2—Sr1—S3v138.88 (4)S2iii—Sr1—Tl1i83.79 (4)
S3ii—Sr1—S3v91.588 (16)S2i—Sr1—Tl1i83.79 (4)
S3iii—Sr1—S3v127.32 (3)P1iv—Sr1—Tl1i139.03 (4)
S3iv—Sr1—S3v63.71 (6)P1—Sr1—Tl1i86.02 (4)
S1—Sr1—S2iii81.08 (4)S1—P1—S2113.15 (14)
S2—Sr1—S2iii75.08 (4)S1—P1—S3108.56 (10)
S3ii—Sr1—S2iii125.99 (5)S2—P1—S3110.09 (9)
S3iii—Sr1—S2iii62.02 (5)S1—P1—S3vi108.56 (10)
S3iv—Sr1—S2iii70.08 (5)S2—P1—S3vi110.09 (9)
S3v—Sr1—S2iii132.59 (5)S3—P1—S3vi106.13 (13)
S1—Sr1—S2i81.08 (4)S1—P1—Sr1vii83.47 (10)
S2—Sr1—S2i75.08 (4)S2—P1—Sr1vii163.37 (12)
S3ii—Sr1—S2i62.02 (5)S3—P1—Sr1vii61.95 (7)
S3iii—Sr1—S2i125.99 (5)S3vi—P1—Sr1vii61.95 (7)
S3iv—Sr1—S2i132.59 (5)S1—P1—Sr155.92 (9)
S3v—Sr1—S2i70.08 (5)S2—P1—Sr157.23 (9)
S2iii—Sr1—S2i149.15 (8)S3—P1—Sr1126.91 (7)
S1—Sr1—P1iv100.63 (6)S3vi—P1—Sr1126.90 (7)
S2—Sr1—P1iv169.40 (6)Sr1vii—P1—Sr1139.40 (6)
S3ii—Sr1—P1iv98.01 (5)P1—S1—Sr189.77 (10)
S3iii—Sr1—P1iv98.01 (5)P1—S2—Sr188.31 (10)
S3iv—Sr1—P1iv35.64 (3)P1—S2—Sr1iii86.63 (5)
S3v—Sr1—P1iv35.64 (3)Sr1—S2—Sr1iii104.92 (4)
S2iii—Sr1—P1iv103.94 (4)P1—S2—Sr1i86.63 (5)
S2i—Sr1—P1iv103.94 (4)Sr1—S2—Sr1i104.92 (4)
S1—Sr1—P134.31 (6)Sr1iii—S2—Sr1i149.15 (8)
S2—Sr1—P134.46 (5)P1—S3—Sr1iii97.57 (8)
S3ii—Sr1—P1119.03 (5)P1—S3—Sr1vii82.41 (7)
S3iii—Sr1—P1119.03 (5)Sr1iii—S3—Sr1vii177.14 (7)
Symmetry codes: (i) x+1, y+1, z+2; (ii) x+1, y+1/2, z+2; (iii) x+1, y, z+2; (iv) x+1/2, y, z+3/2; (v) x+1/2, y+1/2, z+3/2; (vi) x, y+1/2, z; (vii) x1/2, y, z+3/2.

Experimental details

Crystal data
Chemical formulaTlSrPS4
Mr451.20
Crystal system, space groupOrthorhombic, Pnma
Temperature (K)293
a, b, c (Å)12.2985 (8), 6.6003 (6), 8.7957 (6)
V3)713.98 (9)
Z4
Radiation typeMo Kα
µ (mm1)31.28
Crystal size (mm)0.08 × 0.07 × 0.06
Data collection
DiffractometerStoe IPDS
Absorption correctionNumerical
(X-SHAPE; Stoe & Cie, 1998)
Tmin, Tmax0.018, 0.111
No. of measured, independent and
observed [I > 2σ(I)] reflections
6570, 935, 780
Rint0.099
(sin θ/λ)max1)0.659
Refinement
R[F2 > 2σ(F2)], wR(F2), S 0.033, 0.084, 1.03
No. of reflections935
No. of parameters41
Δρmax, Δρmin (e Å3)1.46, 2.30

Computer programs: IPDS (Stoe & Cie, 1998), IPDS, SHELXS97 (Sheldrick, 1997), SHELXL97 (Sheldrick, 1997), ORTEP-3 (Farrugia, 1997) and BS (Version 1.51; Ozawa & Kang, 2004), SHELXL97.

 

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