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The title compound, (C8H20N2)[CdI4], contains isolated 1,1,4,4-tetra­methyl­piperazinium cations and tetra­hedral tetra­iodidocadmate(II) anions, both of which lie on crystallographic twofold rotation axes. The cations and anions lie in layers parallel to the (101) planes.

Supporting information

cif

Crystallographic Information File (CIF) https://doi.org/10.1107/S1600536807050180/bi2243sup1.cif
Contains datablocks I, global

hkl

Structure factor file (CIF format) https://doi.org/10.1107/S1600536807050180/bi2243Isup2.hkl
Contains datablock I

CCDC reference: 667174

Key indicators

  • Single-crystal X-ray study
  • T = 298 K
  • Mean [sigma](C-C) = 0.007 Å
  • R factor = 0.033
  • wR factor = 0.083
  • Data-to-parameter ratio = 29.8

checkCIF/PLATON results

No syntax errors found



Alert level C PLAT066_ALERT_1_C Predicted and Reported Transmissions Identical . ? PLAT128_ALERT_4_C Non-standard setting of Space group P2/c .... P2/n PLAT764_ALERT_4_C Overcomplete CIF Bond List Detected (Rep/Expd) . 1.25 Ratio
Alert level G PLAT794_ALERT_5_G Check Predicted Bond Valency for Cd1 (2) 2.34
0 ALERT level A = In general: serious problem 0 ALERT level B = Potentially serious problem 3 ALERT level C = Check and explain 1 ALERT level G = General alerts; check 1 ALERT type 1 CIF construction/syntax error, inconsistent or missing data 0 ALERT type 2 Indicator that the structure model may be wrong or deficient 0 ALERT type 3 Indicator that the structure quality may be low 2 ALERT type 4 Improvement, methodology, query or suggestion 1 ALERT type 5 Informative message, check

Comment top

The title compound (Me4pip)[CdI4] (where pip denotes piperazine) is composed of isolated tetrahedral [CdI4]2- anions and 1,1,4,4-tetra-methylpiperazinium (Me4pip)2+ cations (Fig. 1), both of which lie on crystallographic twofold rotation axes. There does not appear to be any unusual distortion of the metal-halide distances due to the presence of the (Me4pip)2+ cations: the coordination environment of CdII involves Cd—I bond distances of 2.7664 (10) and 2.7721 (11) A%, with I—Cd—I bond angles ranging between 106.30 (5) and 114.69 (2)°. The cations and anions lie in layers parallel to the (101) planes (Fig. 2), with C—H···I contacts formed between them.

Related literature top

For the structures of the related compounds, (C8H20N2)[FeCl5] and (C4H12N2)[CdI4], see James et al. (1995) and Ishihara et al. (2002), respectively.

Experimental top

Crystals of the title compound were prepared by slow evaporation of a solution containing (Me4pip)I2 (0.796 g, 2 mmol) and CdI2 (1.465 g, 4 mmol) in deionized water (20 ml), acidified by 10 drops of 1M HI. The resulting yellow crystals were obtained in approximately 68% yield (based on Cd).

Refinement top

H atoms were positioned geometrically, with C—H = 0.97 or 0.96 Å and were refined as riding with Uiso(H)= 1.2Ueq(C) or 1.5Ueq(methyl C). The methyl groups were allowed to rotate about their local threefold axes.

Structure description top

The title compound (Me4pip)[CdI4] (where pip denotes piperazine) is composed of isolated tetrahedral [CdI4]2- anions and 1,1,4,4-tetra-methylpiperazinium (Me4pip)2+ cations (Fig. 1), both of which lie on crystallographic twofold rotation axes. There does not appear to be any unusual distortion of the metal-halide distances due to the presence of the (Me4pip)2+ cations: the coordination environment of CdII involves Cd—I bond distances of 2.7664 (10) and 2.7721 (11) A%, with I—Cd—I bond angles ranging between 106.30 (5) and 114.69 (2)°. The cations and anions lie in layers parallel to the (101) planes (Fig. 2), with C—H···I contacts formed between them.

For the structures of the related compounds, (C8H20N2)[FeCl5] and (C4H12N2)[CdI4], see James et al. (1995) and Ishihara et al. (2002), respectively.

Computing details top

Data collection: SMART (Siemens, 1996); cell refinement: SAINT (Siemens, 1994); data reduction: SAINT (Siemens, 1994); program(s) used to solve structure: SHELXS97 (Sheldrick, 1997); program(s) used to refine structure: SHELXL97 (Sheldrick, 1997); molecular graphics: SHELXTL (Siemens, 1994) and DIAMOND (Brandenburg, 2004); software used to prepare material for publication: SHELXTL (Siemens, 1994).

Figures top
[Figure 1] Fig. 1. The molecular structure of the title compound showing displacement ellipsoids at the 35% probability level for non-H atoms.
[Figure 2] Fig. 2. Packing diagram for the title compound. The dashed lines denote intermolecular C—H···I contacts.
1,1,4,4-Tetramethylpiperazinium tetraiodidocadmium(II) top
Crystal data top
(C8H20N2)[CdI4]F(000) = 684
Mr = 764.26Dx = 2.758 Mg m3
Monoclinic, P2/nMo Kα radiation, λ = 0.71073 Å
Hall symbol: -P 2yacCell parameters from 5559 reflections
a = 9.777 (4) Åθ = 2.5–28.3°
b = 7.772 (4) ŵ = 7.88 mm1
c = 12.184 (6) ÅT = 298 K
β = 96.326 (6)°Block, yellow
V = 920.2 (8) Å30.28 × 0.14 × 0.08 mm
Z = 2
Data collection top
Siemens SMART CCD
diffractometer
2118 independent reflections
Radiation source: fine-focus sealed tube1869 reflections with I > 2σ(I)
Graphite monochromatorRint = 0.028
φ and ω scansθmax = 28.3°, θmin = 2.5°
Absorption correction: multi-scan
(SADABS; Sheldrick, 1996)
h = 1012
Tmin = 0.277, Tmax = 0.533k = 610
5322 measured reflectionsl = 1315
Refinement top
Refinement on F2Primary atom site location: structure-invariant direct methods
Least-squares matrix: fullSecondary atom site location: difference Fourier map
R[F2 > 2σ(F2)] = 0.033Hydrogen site location: inferred from neighbouring sites
wR(F2) = 0.083H-atom parameters constrained
S = 1.05 w = 1/[σ2(Fo2) + (0.0397P)2 + 1.5636P]
where P = (Fo2 + 2Fc2)/3
2118 reflections(Δ/σ)max = 0.001
71 parametersΔρmax = 1.30 e Å3
0 restraintsΔρmin = 1.51 e Å3
Crystal data top
(C8H20N2)[CdI4]V = 920.2 (8) Å3
Mr = 764.26Z = 2
Monoclinic, P2/nMo Kα radiation
a = 9.777 (4) ŵ = 7.88 mm1
b = 7.772 (4) ÅT = 298 K
c = 12.184 (6) Å0.28 × 0.14 × 0.08 mm
β = 96.326 (6)°
Data collection top
Siemens SMART CCD
diffractometer
2118 independent reflections
Absorption correction: multi-scan
(SADABS; Sheldrick, 1996)
1869 reflections with I > 2σ(I)
Tmin = 0.277, Tmax = 0.533Rint = 0.028
5322 measured reflections
Refinement top
R[F2 > 2σ(F2)] = 0.0330 restraints
wR(F2) = 0.083H-atom parameters constrained
S = 1.05Δρmax = 1.30 e Å3
2118 reflectionsΔρmin = 1.51 e Å3
71 parameters
Special details top

Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes.

Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > σ(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger.

Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzUiso*/Ueq
Cd10.25000.00204 (7)0.75000.03049 (14)
I10.02271 (3)0.21007 (5)0.71028 (3)0.04278 (13)
I20.20422 (4)0.21594 (5)0.92431 (3)0.04632 (14)
N10.2645 (4)0.7067 (5)0.1294 (3)0.0285 (8)
C10.2223 (5)0.8634 (6)0.1897 (4)0.0314 (10)
H1A0.12270.86920.18340.038*
H1B0.25510.96530.15480.038*
C20.2221 (5)0.5506 (6)0.1900 (4)0.0330 (10)
H2A0.25430.44840.15500.040*
H2B0.12240.54560.18410.040*
C30.4172 (5)0.7061 (8)0.1194 (5)0.0440 (14)
H3A0.46710.70240.19180.066*
H3B0.44140.80850.08200.066*
H3C0.44000.60690.07810.066*
C40.1892 (6)0.7085 (8)0.0150 (4)0.0413 (12)
H4A0.09180.70500.01950.062*
H4B0.21580.61000.02520.062*
H4C0.21190.81160.02250.062*
Atomic displacement parameters (Å2) top
U11U22U33U12U13U23
Cd10.0308 (2)0.0302 (3)0.0304 (3)0.0000.00283 (18)0.000
I10.0360 (2)0.0388 (2)0.0531 (2)0.00967 (14)0.00302 (16)0.00510 (15)
I20.0492 (2)0.0452 (3)0.0447 (2)0.00182 (15)0.00580 (16)0.01700 (16)
N10.0324 (19)0.028 (2)0.026 (2)0.0005 (16)0.0062 (16)0.0007 (16)
C10.039 (2)0.022 (2)0.034 (3)0.0015 (19)0.0040 (19)0.001 (2)
C20.040 (2)0.024 (2)0.035 (3)0.0044 (19)0.008 (2)0.002 (2)
C30.032 (3)0.059 (4)0.044 (3)0.001 (2)0.013 (2)0.004 (3)
C40.049 (3)0.047 (3)0.028 (3)0.000 (2)0.001 (2)0.002 (2)
Geometric parameters (Å, º) top
Cd1—I12.7664 (10)C1—H1B0.970
Cd1—I1i2.7664 (10)C2—C2ii1.504 (10)
Cd1—I22.7721 (11)C2—H2A0.970
Cd1—I2i2.7721 (11)C2—H2B0.970
N1—C21.502 (6)C3—H3A0.960
N1—C11.503 (6)C3—H3B0.960
N1—C41.504 (6)C3—H3C0.960
N1—C31.511 (6)C4—H4A0.960
C1—C1ii1.509 (9)C4—H4B0.960
C1—H1A0.970C4—H4C0.960
I1—Cd1—I1i106.84 (4)N1—C2—C2ii112.8 (3)
I1—Cd1—I2107.28 (2)N1—C2—H2A109.0
I1i—Cd1—I2114.69 (2)C2ii—C2—H2A109.0
I1—Cd1—I2i114.69 (2)N1—C2—H2B109.0
I1i—Cd1—I2i107.28 (2)C2ii—C2—H2B109.0
I2—Cd1—I2i106.30 (5)H2A—C2—H2B107.8
C2—N1—C1108.0 (4)N1—C3—H3A109.5
C2—N1—C4109.2 (4)N1—C3—H3B109.5
C1—N1—C4108.3 (4)H3A—C3—H3B109.5
C2—N1—C3111.5 (4)N1—C3—H3C109.5
C1—N1—C3111.6 (4)H3A—C3—H3C109.5
C4—N1—C3108.2 (4)H3B—C3—H3C109.5
N1—C1—C1ii112.8 (3)N1—C4—H4A109.5
N1—C1—H1A109.0N1—C4—H4B109.5
C1ii—C1—H1A109.0H4A—C4—H4B109.5
N1—C1—H1B109.0N1—C4—H4C109.5
C1ii—C1—H1B109.0H4A—C4—H4C109.5
H1A—C1—H1B107.8H4B—C4—H4C109.5
C2—N1—C1—C1ii54.5 (6)C1—N1—C2—C2ii54.8 (6)
C4—N1—C1—C1ii172.6 (5)C4—N1—C2—C2ii172.3 (5)
C3—N1—C1—C1ii68.4 (6)C3—N1—C2—C2ii68.2 (6)
Symmetry codes: (i) x+1/2, y, z+3/2; (ii) x+1/2, y, z+1/2.

Experimental details

Crystal data
Chemical formula(C8H20N2)[CdI4]
Mr764.26
Crystal system, space groupMonoclinic, P2/n
Temperature (K)298
a, b, c (Å)9.777 (4), 7.772 (4), 12.184 (6)
β (°) 96.326 (6)
V3)920.2 (8)
Z2
Radiation typeMo Kα
µ (mm1)7.88
Crystal size (mm)0.28 × 0.14 × 0.08
Data collection
DiffractometerSiemens SMART CCD
Absorption correctionMulti-scan
(SADABS; Sheldrick, 1996)
Tmin, Tmax0.277, 0.533
No. of measured, independent and
observed [I > 2σ(I)] reflections
5322, 2118, 1869
Rint0.028
(sin θ/λ)max1)0.668
Refinement
R[F2 > 2σ(F2)], wR(F2), S 0.033, 0.083, 1.05
No. of reflections2118
No. of parameters71
H-atom treatmentH-atom parameters constrained
Δρmax, Δρmin (e Å3)1.30, 1.51

Computer programs: SMART (Siemens, 1996), SAINT (Siemens, 1994), SHELXS97 (Sheldrick, 1997), SHELXL97 (Sheldrick, 1997), SHELXTL (Siemens, 1994) and DIAMOND (Brandenburg, 2004), SHELXTL (Siemens, 1994).

 

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