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Approximate methods are described for treating dynamical scattering effects in integrated electron diffraction intensities from unknown structures. In the application to AlmFe, (hk0) structure factors have been determined by combining data from two electron diffraction techniques: energy-filtered convergent-beam electron diffraction (CBED) profiles from the (h00) and (hh0) systematic rows and integrated intensity collected by the precession technique in the [001] projection. The ab initio determination of the (h00) and (hh0) structure factors was based on accurate intensity measurements and n-beam dynamical scattering calculations for the systematic row. The remaining (hk0) structure factors were determined from integrated intensities by means of two-beam-like intensity expressions and the effect of other beams was accounted for by a dynamical potential.
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