Structure Refinements of the Layered Intergrowth Phases Sb^IIISb^{V x}A_1-xTiO₆ (x[asymptotically equal to]0, A = Ta, Nb) Using Synchrotron X-ray Powder Diffraction Data

The structures of the layered intergrowth phases Sb^IIISb^V_xAl-xTiO₆ (x 0, A = Ta, Nb) have been refined by the Rietveld method, using X-ray diffraction data obtained using a synchrotron source. The starting models for these structures were derived from those of Sb^III₃Sb^V_xA_3-xTiO₁₄ (x = 1.26, A = Ta and x = 0.89, A = Nb), previously solved by single-crystal X-ray diffraction. There were no significant differences between the derived models and the final structures, validating the approach used to obtain the models and confirming that the n = 1 and n = 3 members of the family, Sb^III_nSb^V_xA_n-xTiO_4n+2 are part of a structurally homologous series.

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