Effect of thickness and Si substrate morphology in La_0.7Sr_0.3MnO₃/Si thin films

Investigation has been made on atomic, electronic structures and magnetic properties of La0.7Sr0.3MnO3 (LSMO) on Si substrate. The effect of different thickness of LSMO and different morphological [flat and nano-pyramid (NP)] of Si substrate are studied in present work. The result of Mn K-edge extended x-ray absorption fine structure indicates the more disorder of local atomic structure of first shell (Mn-O bound) in the thinner LSMO/Si film. The Mn L3,2-edge x-ray absorption near-edge structure shows the presence of Mn2+ ion on the sample. Furthermore, the Mn L3,2-edge x-ray magnetic circular dichroism reveals that the thinner film (LSMO/Si) has highest magnetic moment, in comparison to that of thick LSMO/Si and LSMO/Si-NP samples. This finding suggests that the appearance Mn2+ may play an important role in magnetic behavior of hetero-junction LSMnO/Si and Si-NP.