An X-ray spectrometer for inelastic scattering experiments. III. Design and performance

In papers I and II of the present series [Suortti, Pattison & Weyrich (1986). J. Appl. Cryst. 19, 336–342, 343–352] a treatment of the X-ray optics of elastically bent perfect crystals was given. These results are now used to optimize the design of an X-ray spectrometer for inelastic scattering experiments, i.e. for the study of Compton and X-ray Raman scattering. A spectrometer of this type has been constructed and tested. The intensity data and test spectra presented here provide a basis for evaluating the spectrometer performance. A comparison is made with conventional apparatus using a γ-ray source and solid-state detector, as well as a crystal spectrometer operating with a synchrotron radiation source.