An absolute intensity standard for small-angle X-ray scattering measured with position-sensitive detectors

Silica sols have been evaluated as a means of determining the incident beam intensity using position-sensitive detectors. Analysis of the total integrated small-angle X-ray scattering yielded an electron density of the suspended silica particles that was within 4% of the electron density of amorphous silica. The sols were found to be particularly well suited for use with position-sensitive detectors and represent a convenient, rapid, and accurate means to determine the incident beam intensity.