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A phase difference between the coherent σ and π components of dynamically diffracted X-rays was observed in the Laue case. The incident X-ray beam was linearly polarized Cu radiation. A Si single crystal was used to produce the phase difference. The Ge 333 reflexion was used to polarize the incident beam and also to examine the polarization state of the diffracted beam in the 220 Laue-case reflexion from a Si crystal. For comparison, the polarization state in the Bragg case was also analysed.
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