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The design and testing of the new MAD-STROBO data acquisition system are reported. The system realizes stroboscopic collection of high-resolution X-ray powder diffraction profiles under a dynamically applied electric field. It synchronizes an externally applied stimulus and detected X-ray photons. The feasibility of detecting sub-millidegree shifts of powder diffraction profiles with microsecond time resolution is demonstrated. MAD-STROBO may be applied for the investigation of various macroscopic and domain-related processes induced by an external perturbation, such as elasticity or piezoelectricity.

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