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The title compound, C24H26O2Si2, has C2 crystallographic symmetry. The dihedral angle between the aromatic rings is 84.5 (2)°. The acetyl­ene group is slightly non-linear, with angles at the acetyl­ene C atoms of 175.7 (2) and 177.0 (2)°. In the crystal structure, only van de Waals interactions occur.

Supporting information

cif

Crystallographic Information File (CIF) https://doi.org/10.1107/S160053681203663X/bx2422sup1.cif
Contains datablocks global, I

hkl

Structure factor file (CIF format) https://doi.org/10.1107/S160053681203663X/bx2422Isup2.hkl
Contains datablock I

cml

Chemical Markup Language (CML) file https://doi.org/10.1107/S160053681203663X/bx2422Isup3.cml
Supplementary material

CCDC reference: 899769

Key indicators

  • Single-crystal X-ray study
  • T = 120 K, P = 0.0 kPa
  • Mean [sigma](C-C) = 0.002 Å
  • R factor = 0.043
  • wR factor = 0.103
  • Data-to-parameter ratio = 26.0

checkCIF/PLATON results

No syntax errors found



Alert level C PLAT230_ALERT_2_C Hirshfeld Test Diff for Si1 -- C4 .. 5.4 su PLAT242_ALERT_2_C Check Low Ueq as Compared to Neighbors for Si1 PLAT369_ALERT_2_C Long C(sp2)-C(sp2) Bond C12 - C12_a ... 1.54 Ang. PLAT911_ALERT_3_C Missing # FCF Refl Between THmin & STh/L= 0.600 2
Alert level G REFLT03_ALERT_1_G ALERT: Expected hkl max differ from CIF values From the CIF: _diffrn_reflns_theta_max 30.03 From the CIF: _reflns_number_total 3410 From the CIF: _diffrn_reflns_limit_ max hkl 12. 10. 33. From the CIF: _diffrn_reflns_limit_ min hkl -12. -10. -31. TEST1: Expected hkl limits for theta max Calculated maximum hkl 12. 12. 33. Calculated minimum hkl -12. -12. -33. REFLT03_ALERT_4_G Please check that the estimate of the number of Friedel pairs is correct. If it is not, please give the correct count in the _publ_section_exptl_refinement section of the submitted CIF. From the CIF: _diffrn_reflns_theta_max 30.03 From the CIF: _reflns_number_total 3410 Count of symmetry unique reflns 1993 Completeness (_total/calc) 171.10% TEST3: Check Friedels for noncentro structure Estimate of Friedel pairs measured 1417 Fraction of Friedel pairs measured 0.711 Are heavy atom types Z>Si present yes PLAT005_ALERT_5_G No _iucr_refine_instructions_details in CIF .... ? PLAT371_ALERT_2_G Long C(sp2)-C(sp1) Bond C5 - C6 ... 1.44 Ang. PLAT850_ALERT_4_G Check Flack Parameter Exact Value 0.00 and su .. 0.10 PLAT951_ALERT_5_G Reported and Calculated Kmax Values Differ by .. 2
0 ALERT level A = Most likely a serious problem - resolve or explain 0 ALERT level B = A potentially serious problem, consider carefully 4 ALERT level C = Check. Ensure it is not caused by an omission or oversight 6 ALERT level G = General information/check it is not something unexpected 1 ALERT type 1 CIF construction/syntax error, inconsistent or missing data 4 ALERT type 2 Indicator that the structure model may be wrong or deficient 1 ALERT type 3 Indicator that the structure quality may be low 2 ALERT type 4 Improvement, methodology, query or suggestion 2 ALERT type 5 Informative message, check

Comment top

The title compound (I), (C12H13OSi)2, lies on a crystallographic twofold axis. The phenyl ring is planar - all six C atoms have δ/σ < 0.2. However, carbonyl carbon C12 is 0.217 (5) Å above the C11—O1—C12' plane, and the C10—C11—C12—O1 torsion angle is 19.5 (3)°. The ethanedione C12(sp2)—C12(sp2)' distance of 1.538 (4) Å is somewhat longer than expected, but is consistent with values reported for benzil, which average 1.536 (10) Å. The acetylenic moiety is non-linear with deviations from a weighted least-squares line of δ(Si1) = 0.0034 (15), δ(C4) = 0.054 (4), δ(C5) = 0.049 (4), and δ(C6) = 0.047 (4) Å. The crystal structure is stablized by van der Waals interactions.

Related literature top

For the structure of benzil, see Brown & Sadanaga (1965); Gabe et al. (1981); More et al. (1987). For the synthesis see: Garcia et al. (1995). For the determination of absolute configuration from Bijvoet pairs, see: Hooft et al. (2008).

Experimental top

The title compound was supplied by J. Gabriel Garcia, having been synthesized from 1,2-bis-(2-bromophenyl)-ethane-1,2-dione and trimethylsilyl acetylene (Garcia et al., 1995).

Refinement top

The space group assignment and absolute structure are based on analysis of 1419 Bijvoet pairs, Flack (1983) parameter x = 0.0 (1), Hooft et al. (2008) parameter y = -0.04 (7), and Hooft P2(true) = 1.000.

All H atoms were placed in calculated positions with C—H distances of 0.95 (aromatic) and 0.98 Å (methyl) and Uiso = 1.2 or 1.5 Ueq of the attached sp2 or sp3 C atom, and thereafter treated as riding. A torsional parameter was refined for each methyl group.

Computing details top

Data collection: COLLECT (Nonius, 2000); cell refinement: DENZO and SCALEPACK (Otwinowski & Minor, 1997); data reduction: DENZO and SCALEPACK (Otwinowski & Minor, 1997); program(s) used to solve structure: SIR2002 (Burla et al., 2003); program(s) used to refine structure: SHELXL97 (Sheldrick, 2008); molecular graphics: ORTEP-3 for Windows (Farrugia, 1997); software used to prepare material for publication: WinGX (Farrugia, 1999).

Figures top
Figure 1. View of (I) (50% probability displacement ellipsoids)
1,2-Bis{2-[2-(trimethylsilyl)ethynyl]phenyl}ethane-1,2-dione top
Crystal data top
C24H26O2Si2Dx = 1.145 Mg m3
Mr = 402.63Mo Kα radiation, λ = 0.71073 Å
Trigonal, P3221Cell parameters from 3424 reflections
Hall symbol: P 32 2"θ = 2.5–30.0°
a = 9.2241 (1) ŵ = 0.17 mm1
c = 23.7787 (5) ÅT = 120 K
V = 1752.13 (5) Å3Rhombohedron, yellow
Z = 30.25 × 0.25 × 0.25 mm
F(000) = 642
Data collection top
Nonius KappaCCD
diffractometer
3410 independent reflections
Radiation source: sealed tube2325 reflections with I > 2σ(I)
Horizonally mounted graphite crystal monochromatorRint = 0.047
Detector resolution: 9 pixels mm-1θmax = 30.0°, θmin = 2.6°
ω and ϕ scansh = 1212
Absorption correction: multi-scan
(SCALEPACK; Otwinowski & Minor, 1997)
k = 1010
Tmin = 0.959, Tmax = 0.959l = 3133
23012 measured reflections
Refinement top
Refinement on F2Secondary atom site location: difference Fourier map
Least-squares matrix: fullHydrogen site location: inferred from neighbouring sites
R[F2 > 2σ(F2)] = 0.043H-atom parameters constrained
wR(F2) = 0.103 w = 1/[σ2(Fo2) + (0.0519P)2]
where P = (Fo2 + 2Fc2)/3
S = 1.00(Δ/σ)max < 0.001
3410 reflectionsΔρmax = 0.25 e Å3
131 parametersΔρmin = 0.21 e Å3
0 restraintsAbsolute structure: Flack (1983), 1419 Bijvoet pairs
0 constraintsAbsolute structure parameter: 0.0 (1)
Primary atom site location: structure-invariant direct methods
Crystal data top
C24H26O2Si2Z = 3
Mr = 402.63Mo Kα radiation
Trigonal, P3221µ = 0.17 mm1
a = 9.2241 (1) ÅT = 120 K
c = 23.7787 (5) Å0.25 × 0.25 × 0.25 mm
V = 1752.13 (5) Å3
Data collection top
Nonius KappaCCD
diffractometer
3410 independent reflections
Absorption correction: multi-scan
(SCALEPACK; Otwinowski & Minor, 1997)
2325 reflections with I > 2σ(I)
Tmin = 0.959, Tmax = 0.959Rint = 0.047
23012 measured reflections
Refinement top
R[F2 > 2σ(F2)] = 0.043H-atom parameters constrained
wR(F2) = 0.103Δρmax = 0.25 e Å3
S = 1.00Δρmin = 0.21 e Å3
3410 reflectionsAbsolute structure: Flack (1983), 1419 Bijvoet pairs
131 parametersAbsolute structure parameter: 0.0 (1)
0 restraints
Special details top

Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes.

Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzUiso*/Ueq
C10.4411 (3)0.1681 (3)0.00979 (9)0.0487 (6)
H1A0.54790.09850.00950.073*
H1B0.35390.2330.0180.073*
H1C0.45220.24470.03570.073*
C20.1985 (3)0.1571 (4)0.09491 (10)0.0714 (8)
H2A0.22220.22470.12110.107*
H2B0.10220.23090.07140.107*
H2C0.17310.08150.11620.107*
C30.3475 (4)0.1018 (3)0.00053 (11)0.0802 (10)
H3A0.32090.17630.02190.12*
H3B0.25390.03140.02450.12*
H3C0.44870.16880.02190.12*
C40.5616 (2)0.1008 (2)0.09647 (7)0.0310 (4)
C50.6750 (2)0.1814 (2)0.12846 (7)0.0282 (4)
C60.8026 (2)0.2815 (2)0.16901 (6)0.0283 (4)
C70.8414 (2)0.4474 (2)0.17783 (8)0.0346 (5)
H70.78810.49310.15580.042*
C80.9559 (2)0.5446 (2)0.21811 (8)0.0385 (5)
H80.9820.65720.22330.046*
C91.0332 (2)0.4800 (2)0.25096 (7)0.0381 (5)
H91.11160.54790.27890.046*
C100.9970 (2)0.3169 (2)0.24337 (7)0.0352 (4)
H101.04970.27250.26640.042*
C110.8830 (2)0.2166 (2)0.20188 (7)0.0274 (4)
C120.8518 (2)0.0429 (2)0.19563 (7)0.0309 (4)
O10.88376 (18)0.02847 (17)0.23231 (6)0.0457 (4)
Si10.38331 (7)0.03278 (7)0.04974 (2)0.03309 (15)
Atomic displacement parameters (Å2) top
U11U22U33U12U13U23
C10.0621 (15)0.0523 (14)0.0410 (11)0.0355 (13)0.0166 (11)0.0167 (10)
C20.0331 (13)0.092 (2)0.0657 (15)0.0134 (14)0.0059 (12)0.0155 (14)
C30.108 (2)0.0446 (14)0.0940 (18)0.0423 (15)0.0758 (18)0.0214 (13)
C40.0351 (10)0.0292 (10)0.0311 (9)0.0178 (9)0.0057 (8)0.0005 (8)
C50.0316 (10)0.0258 (9)0.0288 (9)0.0156 (8)0.0008 (8)0.0041 (8)
C60.0246 (9)0.0290 (10)0.0243 (8)0.0083 (8)0.0013 (7)0.0042 (8)
C70.0346 (11)0.0295 (11)0.0344 (10)0.0120 (9)0.0044 (8)0.0022 (8)
C80.0361 (12)0.0273 (11)0.0401 (11)0.0068 (10)0.0020 (9)0.0008 (8)
C90.0256 (10)0.0386 (11)0.0312 (9)0.0019 (9)0.0042 (8)0.0033 (8)
C100.0233 (9)0.0403 (11)0.0339 (9)0.0098 (9)0.0013 (8)0.0075 (8)
C110.0194 (8)0.0302 (9)0.0260 (8)0.0075 (8)0.0033 (7)0.0069 (7)
C120.0196 (9)0.0329 (10)0.0361 (10)0.0101 (8)0.0025 (8)0.0105 (8)
O10.0440 (9)0.0402 (9)0.0499 (8)0.0188 (8)0.0108 (7)0.0125 (7)
Si10.0354 (3)0.0283 (3)0.0372 (3)0.0172 (3)0.0128 (2)0.0072 (2)
Geometric parameters (Å, º) top
C1—Si11.847 (2)C5—C61.443 (2)
C1—H1A0.98C6—C71.403 (3)
C1—H1B0.98C6—C111.401 (3)
C1—H1C0.98C7—C81.375 (3)
C2—Si11.849 (2)C7—H70.95
C2—H2A0.98C8—C91.378 (3)
C2—H2B0.98C8—H80.95
C2—H2C0.98C9—C101.380 (3)
C3—Si11.852 (2)C9—H90.95
C3—H3A0.98C10—C111.401 (2)
C3—H3B0.98C10—H100.95
C3—H3C0.98C11—C121.487 (3)
C4—C51.203 (2)C12—O11.214 (2)
C4—Si11.8522 (19)C12—C12i1.538 (4)
Si1—C1—H1A109.5C8—C7—H7119.7
Si1—C1—H1B109.5C6—C7—H7119.7
H1A—C1—H1B109.5C9—C8—C7120.52 (19)
Si1—C1—H1C109.5C9—C8—H8119.7
H1A—C1—H1C109.5C7—C8—H8119.7
H1B—C1—H1C109.5C8—C9—C10120.12 (17)
Si1—C2—H2A109.5C8—C9—H9119.9
Si1—C2—H2B109.5C10—C9—H9119.9
H2A—C2—H2B109.5C9—C10—C11120.31 (17)
Si1—C2—H2C109.5C9—C10—H10119.8
H2A—C2—H2C109.5C11—C10—H10119.8
H2B—C2—H2C109.5C6—C11—C10119.58 (17)
Si1—C3—H3A109.5C6—C11—C12123.09 (16)
Si1—C3—H3B109.5C10—C11—C12117.32 (17)
H3A—C3—H3B109.5O1—C12—C11122.93 (17)
Si1—C3—H3C109.5O1—C12—C12i115.72 (18)
H3A—C3—H3C109.5C11—C12—C12i120.33 (17)
H3B—C3—H3C109.5C3—Si1—C1109.67 (11)
C5—C4—Si1177.01 (16)C3—Si1—C2111.37 (14)
C4—C5—C6175.7 (2)C1—Si1—C2111.58 (13)
C7—C6—C11118.82 (16)C3—Si1—C4109.27 (10)
C7—C6—C5118.66 (17)C1—Si1—C4107.33 (9)
C11—C6—C5122.44 (17)C2—Si1—C4107.49 (9)
C8—C7—C6120.63 (18)
C11—C6—C7—C80.2 (3)C9—C10—C11—C61.6 (3)
C5—C6—C7—C8176.61 (16)C9—C10—C11—C12179.24 (16)
C6—C7—C8—C90.7 (3)C6—C11—C12—O1159.64 (18)
C7—C8—C9—C100.5 (3)C10—C11—C12—O119.5 (3)
C8—C9—C10—C110.7 (3)C6—C11—C12—C12i32.4 (2)
C7—C6—C11—C101.3 (2)C10—C11—C12—C12i148.44 (13)
C5—C6—C11—C10175.35 (16)C11—C12—C12i—C11i132.9 (2)
C7—C6—C11—C12179.56 (16)C11—C12—C12i—O1i58.36 (11)
C5—C6—C11—C123.8 (3)O1—C12—C12i—O1i110.4 (3)
Symmetry code: (i) xy, y, z+1/3.

Experimental details

Crystal data
Chemical formulaC24H26O2Si2
Mr402.63
Crystal system, space groupTrigonal, P3221
Temperature (K)120
a, c (Å)9.2241 (1), 23.7787 (5)
V3)1752.13 (5)
Z3
Radiation typeMo Kα
µ (mm1)0.17
Crystal size (mm)0.25 × 0.25 × 0.25
Data collection
DiffractometerNonius KappaCCD
diffractometer
Absorption correctionMulti-scan
(SCALEPACK; Otwinowski & Minor, 1997)
Tmin, Tmax0.959, 0.959
No. of measured, independent and
observed [I > 2σ(I)] reflections
23012, 3410, 2325
Rint0.047
(sin θ/λ)max1)0.704
Refinement
R[F2 > 2σ(F2)], wR(F2), S 0.043, 0.103, 1.00
No. of reflections3410
No. of parameters131
H-atom treatmentH-atom parameters constrained
Δρmax, Δρmin (e Å3)0.25, 0.21
Absolute structureFlack (1983), 1419 Bijvoet pairs
Absolute structure parameter0.0 (1)

Computer programs: COLLECT (Nonius, 2000), DENZO and SCALEPACK (Otwinowski & Minor, 1997), SIR2002 (Burla et al., 2003), SHELXL97 (Sheldrick, 2008), ORTEP-3 for Windows (Farrugia, 1997), WinGX (Farrugia, 1999).

 

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