Image deconvolution of a single high-resolution electron micrograph

An X-ray crystallographic method has been introduced into the image processing of high-resolution electron microscopy. This enables the deconvolution of single electron micrographs of a crystalline sample. For this purpose the chemical composition of the sample should be known approximately, the image should be taken near the optimum defocus condition, but no preliminary knowledge of the crystal structure is needed. The method has been proved to be efficient with a high-resolution electron micrograph of chlorinated copper phthalocyanine taken on the Kyoto 500 kV electron microscope.