Journal of Applied Crystallography

Volume 28, Part 4 (August 1995)

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J. Appl. Cryst. (1995). 28, 447-450    [ doi:10.1107/S0021889895001920 ]

Determination of dmin and [lambda]min from the Intensity Distributions of Laue Patterns

Q. Hao, M. M. Harding and J. W. Campbell

Abstract: The parameters dmin and [lambda]min, essential for the processing of synchrotron X-ray Laue patterns, can be efficiently estimated by examination of the distribution of measured intensities as a function of d spacing and wavelength, respectively. A procedure that can be carried out automatically as one step in the data processing has been tested with Laue data sets from an organometallic compound and two proteins.

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