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A specific case of the doping method [Popovic & Grzeta-Plenkovic (1979). J. Appl. Cryst. 12, 205-208] is elaborated, in which the weight fraction of a crystalline component in the multicomponent system can be determined from the measurement of diffraction line intensities of that component only. Optimum conditions to attain maximum accuracy of the doping method are discussed.
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