Dislocation density and Burgers vector population in fiber-textured Ni thin films determined by high-resolution X-ray line profile analysis

Nanocrystalline Ni thin films have been produced by direct current electrodeposition with different additives and current density in order to obtain <100>, <111> and <211> major fiber textures. The dislocation density, the Burgers vector population and the coherently scattering domain size distribution are determined by high-resolution X-ray diffraction line profile analysis. The substructure parameters are correlated with the strength of the films by using the combined Taylor and Hall-Petch relations. The convolutional multiple whole profile method is used to obtain the substructure parameters in the different coexisting texture components. A strong variation of the dislocation density is observed as a function of the deposition conditions.