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In a recent paper [Ruland & Smarsly (2002). J. Appl. Cryst. 35, 624-633], an advanced method for the evaluation of the small-angle X-ray scattering (SAXS) from oriented lamellar systems was presented. In the present work, a comparable method is developed for the study of oriented cylinder arrays. Basic differences between the two methods are found in the way in which the preferred orientation affects the intensity distribution. The method is applied to the SAXS of SiO2-surfactant nanocomposite films which contain highly oriented arrays of cylinders. It is shown that up to eight structural parameters can be obtained by this method which characterize size, imperfection and preferred orientation of the two-dimensional hexagonal lattice formed by the cylinders, the radius and the polydispersity of the cylinders, and the interface boundary.

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