Journal of Synchrotron Radiation

Volume 15, Part 4 (July 2008)

research papers

J. Synchrotron Rad. (2008). 15, 392-398 [ doi:10.1107/S0909049508007486 ]

High-resolution angular beam stability monitoring at a nanofocusing beamline

R. Tucoulou, G. Martinez-Criado, P. Bleuet, I. Kieffer, P. Cloetens, S. Labouré, T. Martin, C. Guilloud and J. Susini

Abstract: Two semi-transparent imaging beam-position monitors developed at the ESRF have been installed at the micro-analysis beamline ID22 for monitoring the angular stability of the X-ray beam. This system allows low-frequency (10 Hz) angular beam stability measurements at a submicroradian range. It is demonstrated that the incoming macro-beam angular fluctuations are one of the major sources of focal spot instabilities downstream of the Kirkpatrick-Baez mirrors. It is also shown that scanning the energy by rotating the so-called fixed-exit monochromator induces some unexpected angular beam shifts that are, to a large extent, deterministic.

Keywords: beam-position monitoring; X-ray camera; nanoprobe.