J. Synchrotron Rad. (2007). 14, 163-168 [ doi:10.1107/S0909049506045304 ]
Abstract: A sputtering chamber for the growth of artificial superlattices of oxide-based materials is described. The chamber is designed to fit into a standard Huber eight-circle diffractometer. The chamber serves for investigation with synchrotron radiation of growth characteristics of oxide-based artificial superlattices in situ. Two Be windows of large area in the vacuum chamber enable measurement of reflections of X-rays at entrance and exit angles up to
50°. Large perpendicular momentum transfers are practical with this apparatus. The possibility of investigating X-ray scattering in situ is demonstrated by observation of the effects of the modulation length and the stacking period on the growth characteristics of BaTiO3/LaNiO3 artificial superlattices.
Keywords: X-ray diffraction; X-ray reflectivity; artificial superlattices; RF sputtering.
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