Acta Cryst. (1996). B52, 479-486 [ doi:10.1107/S0108768195015096 ]
Abstract: Data were collected close to the Ni K edge, using synchrotron radiation at the National Synchrotron Light Source, and using a Mo K
rotating anode, from a crystal of a nickel-containing aluminophosphate, NiAl3P4O18C4H21N4 (NiAPO). These data sets, along with an existing Cu K
rotating anode data set, allowed the calculation of several f' difference-Fourier maps exploiting the difference in f' for Ni between the various wavelengths. These differences are expected to be 7.8, 4.5 and 3.3 e for Mo K
data to SR (synchrotron radiation), Cu K
to SR and Mo K
to Cu K
, respectively. The phases were calculated either excluding the Ni atom or with Al at the Ni-atom site. The f' difference-Fourier maps revealed peaks at the Ni-atom site, whose height and distance from the refined Ni-atom position depended on the f' difference and the phase set used. The largest peak was located at a distance of only 0.025 Å from the refined Ni-atom site and was obtained from the f' difference map calculated with the coefficients |FMo K
- FSR| , using phases calculated with Al at the Ni-atom site. In all cases, it was found that these phases gave optimal results without introducing bias into the maps. The results confirm and expand upon earlier results [Helliwell, Gallois, Kariuki, Kaucic & Helliwell (1993), Acta Cryst. B49, 420-428]. The techniques described are generally applicable to other systems containing anomalous scatterers in chemical crystallography.
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