Acta Crystallographica Section A

Foundations of Crystallography

Volume 64, Part 2 (March 2008)

research papers

Acta Cryst. (2008). A64, 321-325 [ doi:10.1107/S010876730800247X ]

Precise determination of anomalous scattering factors of Ge by using X-ray resonant scattering

M. Yoshizawa, S. Zhou, R. Negishi, T. Fukamachi and T. Kawamura

Abstract: Variations of peak position of the rocking curve in the Bragg case are measured from a Ge thin crystal near the K-absorption edge. The variations are caused by a phase change of the real part of the atomic scattering factor. Based on the measurement, the values of the real part are determined with an accuracy of better than 1%. The values are the most reliable ones among those reported values so far as they are directly determined from the normal atomic scattering factors.

Keywords: anomalous scattering factors of Ge; X-ray resonant scattering.