Acta Cryst. (2003). A59, 163-167 [ doi:10.1107/S0108767303000485 ]
Abstract: A general-purpose method that includes nearly all possible two-beam diffraction mechanisms is presented for calculating diffracted and specularly reflected X-ray intensities from single crystals. Based on this method, it is demonstrated that a small universal computational routine can be developed to accurately treat two-beam diffraction for any scattering geometry.
Keywords: dynamical theory; dispersion equation; computation procedure.
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