Journal of Applied Crystallography

Volume 32, Part 6 (December 1999)

research papers

J. Appl. Cryst. (1999). 32, 1145-1151 [ doi:10.1107/S0021889899011462 ]

Parallel-slit analyzer developed for the purpose of lowering tails of diffraction profiles

G. Fujinawa, H. Toraya and J.-L. Staudenmann

Abstract: A parallel-slit analyzer (PSA) has been developed for the purpose of lowering tails in diffraction profiles from powders and thin films. In the present work, four different materials were used for the foils: sintered and hot-pressed tungsten (W), cold-worked stainless steel (SUS), beryllium bronze (Cu₉₈Be₂) and chemically surface-processed beryllium bronze (CuOx). The PSAs were tested in a parallel-beam geometry using Cu K [alpha] radiation collimated with a graded d-spacing parabolic multilayer mirror. The W and CuOx PSAs gave pseudo-Voigt profiles of 80% Gaussian in the direct-beam case. Textured and roughened surfaces of W and CuOx foils are considered effective for depressing total-reflection effects from the surfaces of the foil materials, and consequently for lowering the tails of diffraction peaks.