Journal of Applied Crystallography

Volume 31, Part 1 (February 1998)

research papers

J. Appl. Cryst. (1998). 31, 7-9 [ doi:10.1107/S0021889897006213 ]

Small-Angle X-ray Scattering Study of the Interfacial Characteristics Between ' Phase and Matrix in Al-2.70 mass% Li Alloy

Z. G. Chai and C. F. Meng

Abstract: Small-angle X-ray scattering (SAXS) has been used to study the [delta] ' precipitation in an Al-2.70 mass% Li alloy aged at 463 K for 8 and 30 h. It is shown that the SAXS profile does not agree with Porod's law and has a negative slope. This suggests that the dispersive interfacial layer exists between the [delta] ' phase and the matrix. It is positive evidence that spinodal decomposition takes place during the precipitation process of the [delta] ' phase. The thicknesses of the interfacial layers are found to be 4.75 and 6.63 nm for the samples aged at 463 K for 8 and 30 h, respectively.