Journal of Applied Crystallography

Volume 30, Part 4 (August 1997)

research papers

J. Appl. Cryst. (1997). 30, 456-460 [ doi:10.1107/S0021889897000721 ]

The /2 Side-Reflection Laue Technique and the New Chart

Y.-H. Park, H.-Y. Yeom, H.-G. Yoon and K.-W. Kim

Abstract: For the capability of dynamic studies of structural changes of crystals under the environment of heat, electric or magnetic field, the /2 side-reflection Laue technique is performed in which the X-ray source, the specimen and the film are aligned along an L-shaped track. A new chart has also been designed for the analysis of /2 side-reflection Laue patterns. This new chart is applied to the analysis of crystal orientation in the /2 side-reflection Laue technique and to indexing the planes of simultaneous multiple-reflection images in Berg-Barrett topography. Also, the equation of zonal trace has been derived for depicting the zonal curves of configurations of /2 side-reflection spots and confirming the results which are analyzed by the new chart.