Journal of Applied Crystallography

Volume 30, Part 5 Number 1 (October 1997)

short communications

J. Appl. Cryst. (1997). 30, 544-546 [ doi:10.1107/S0021889897000198 ]

Smoothing of low-intensity noisy X-ray diffraction data by Fourier filtering: application to supported metal catalyst studies

B. Mierzwa and J. Pielaszek

Abstract: A Wiener filtering algorithm was used to smooth broad and noisy X-ray diffraction (XRD) patterns from highly dispersed catalysts with low metal loading. It enabled extraction of XRD patterns from the active phases of the catalysts interpretable in terms of phase composition.