Journal of Applied Crystallography

Volume 29, Part 5 (October 1996)

laboratory notes

J. Appl. Cryst. (1996). 29, 604-606 [ doi:10.1107/S0021889896007479 ]

Two methods of expanding the measurement abilities of a four-circle diffractometer

T. Steinborn, H. Fuess and H. Adrian

Abstract: The measuring routines of a conventional four-circle diffractometer (Stoe) have been modified to allow various scan types in a fully automatic mode. Scan parameters may be entered either as angular (2, , , ) or as hkl values and are given by two ASCII input files. A set of scans in up to four dimensions may be performed. Scans performed with hkl values are based on the orientation matrix of the single-crystal or the matrix of the substrate for the investigations of partially crystallized thin films. The relative orientations of thin films and substrates can be determined.