Journal of Applied Crystallography

Volume 29, Part 5 (October 1996)

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J. Appl. Cryst. (1996). 29, 568-573    [ doi:10.1107/S0021889896006401 ]

X-ray Moiré Topography on SIMOX Structures

M. Ohler, E. Prieur and J. Härtwig

Synopsis: From Moiré fringes observed on X-ray diffraction topographs of SIMOX (separation by implantation of oxygen) structures, the in-plane components of the triclinic relative strain are determined.

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