J. Appl. Cryst. (1996). 29, 511-515 [ doi:10.1107/S0021889896001550 ]
Abstract: A comprehensive discussion of the resolution function in specular and diffuse X-ray reflectivity is given. This is particularly relevant due to the proliferation of this technique in the field of liquid and solid surfaces and multilayer systems. A simple quantitatively correct interpretation of the diffuse reflectivity is possible if the resolution function is separable for the two directions in the scattering plane. This can be accomplished using a symmetric resolution set-up and specific types of scans (so-called radial scans and rocking scans).
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