Journal of Applied Crystallography

Volume 29, Part 2 (April 1996)

research papers

J. Appl. Cryst. (1996). 29, 110-117 [ doi:10.1107/S0021889895008144 ]

Two-Dimensional Desmearing of Centrosymmetric Small-Angle X-ray Scattering Diffraction Patterns

V. Le Flanchec, D. Gazeau, J. Taboury and Th. Zemb

Abstract: Owing to the high dynamic range and resolution of image plates, digitization of the direct-beam profile as well as of two-dimensional small-angle X-ray scattering patterns gives data with enough accuracy to allow desmearing of two-dimensional patterns after corrections of geometrical distortions. A radial conversion of the images is used to compress the images and to isolate a small area of interest. The results obtained by the Wiener filtering method and the iterative method of Van Cittert on simulated patterns are compared.