J. Appl. Cryst. (1995). 28, 369-374 [ doi:10.1107/S0021889895001750 ]
Abstract: This paper reviews the transmission and reflection texture techniques in order to develop the correction formulae in each of these methods for application to fluorescent thin-film analysis. The method is applied to iron samples deposited on glass substrates in order to prove the efficiency of these corrections in the case of the Schulz reflection geometry. The columnar growth of these films is shown to be dependent on the incident flux inclination.
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