Journal of Applied Crystallography

Volume 26, Part 6 (December 1993)

short communications

J. Appl. Cryst. (1993). 26, 845 [ doi:10.1107/S0021889893010660 ]

Remeasurement of the profile of the characteristic Cu K emission line with high precision and accuracy. Erratum

J. Härtwig, G. Hölzer, J. Wolf and E. Förster

Abstract: Two errors in the paper by Härtwig, Hölzer, Wolf & Förster [J. Appl. Cryst. (1993), 26, 539-548] are corrected. On p. 540, the fifth line after equation (1) should read `₁, ₂ and are small tilts of the crystals and the collimator, respectively'. In the reference list, the reference to Wilson (1958) should read Wilson, A. J. C. (1958). Proc. Phys. Soc. London, 72, 924-925.