Journal of Applied Crystallography

Volume 26, Part 6 (December 1993)

research papers

J. Appl. Cryst. (1993). 26, 756-762 [ doi:10.1107/S0021889893004388 ]

The half-widths of Bragg intensity profiles measured with a triple-crystal diffractometer at a synchrotron-radiation source. II. The half-widths of YIG and Si single crystals

E. Rossmanith, M. Werner, G. Kumpat, G. Ulrich and K. Eichhorn

Abstract: The practical usefulness of the expressions for the half-width proposed in paper I [Rossmanith (1993). J. Appl. Cryst. 26, 753-755] are demonstrated for three examples: a spherical YIG (yttrium iron garnet) crystal, a spherical silicon crystal and a plane-parallel perfect silicon plate. The new concept for the calculation of the width results in theoretical widths that are in excellent agreement with experimental widths observed in parallel and antiparallel arrangements of the sample with respect to the second monochromator crystal.