Journal of Applied Crystallography

Volume 26, Part 4 (August 1993)

research papers

J. Appl. Cryst. (1993). 26, 570-573 [ doi:10.1107/S0021889893001517 ]

Twinning study of CdTe epitaxic layer by X-ray -scan measurement

C. Brizard, G. Rolland and F. Laugier

Abstract: A new application of an X-ray -scan setup is presented. The motion has been installed on an X-ray powder diffractometer. The application of this system to twinned crystals is described. The X-ray -scan diffraction pattern can show twins in the crystal studies to a very good precision. The ratio between the twin diffraction peaks and those from the crystal matrix gives the twin yield. This method is a great deal faster and more precise than the previous one used to study twins, which consisted of recording successively the various diffraction peaks of a chosen plane on a simple diffraction setup.