Journal of Applied Crystallography

Volume 26, Part 4 (August 1993)

research papers

J. Appl. Cryst. (1993). 26, 539-548 [ doi:10.1107/S0021889893000160 ]

Remeasurement of the profile of the characteristic Cu K emission line with high precision and accuracy

J. Härtwig, G. Hölzer, J. Wolf and E. Förster

Abstract: Single- and double-crystal spectrometer measurements of the Cu K doublet have been carried out after the selection of optimum measurement procedures and parameters. These include the influences of the X-ray-tube arrangement, horizontal and vertical divergences and the slow or dependence of the reflection curve. The influence of the apparatus function on the measured intensity distribution was minimized. The measured intensity profile could be approximated by a convolution of the instrumental function and the spectral line, with the inclusion of two additional terms. The intrinsic spectral line was fitted by Lorentz functions and, thus, described by 12 parameters. Good agreement between the results of the different measuring procedures and those of other authors is obtained. The apparent differences are discussed.