Journal of Applied Crystallography

Volume 40, Supplement (April 2007)

Plenary papers

J. Appl. Cryst. (2007). 40 (Supplement), s18-s22

Structure and dynamics of thin polymer films using synchrotron X-ray scattering

Z. Jiang, H. Kim, H. Lee, Y. J. Lee, X. Jiao, C. Li, L. B. Lurio, X. Hu, J. Lal, S. Narayanan, A. Sandy, M. Rafailovich and S. K. Sinha

Abstract: Recent measurements of the scattering function and of the dynamics of surface and interfacial fluctuations in thin supported molten films and bilayers using synchrotron X-ray diffuse scattering and photon correlation spectroscopy in reflection geometry are reported. The results for monolayer films thicker than four times of the radius of gyration of polystyrene show behavior of normal over-damped capillary waves expected for the surface fluctuations of a viscous liquid. However, thinner films show deviations indicating the need to account for viscoelasticity. The theory has been extended to the surface and interfacial modes in a bilayer film system. The results are discussed in terms of surface tension, viscosity and shear modulus. Also recent experiments to measure the isothermal compressibility of supported polystyrene films by studying `bulk' scattering from the interior of the films is discussed.

Keywords: X-ray diffuse scattering; X-ray photon correlation spectroscopy; polymer films.