Journal of Applied Crystallography

Volume 39, Part 5 (October 2006)

research papers

J. Appl. Cryst. (2006). 39, 652-655 [ doi:10.1107/S0021889806025696 ]

A new approach to wide-angle dynamical X-ray diffraction by deformed crystals

S. G. Podorov, N. N. Faleev, K. M. Pavlov, D. M. Paganin, S. A. Stepanov and E. Förster

Abstract: A new approach is proposed for X-ray dynamical diffraction theory in distorted crystals. The theory allows one to perform dynamical diffraction simulations between Bragg peaks for non-ideal crystals, using a simple approach of two distorted waves. It can be directly applied for reciprocal-space simulation. The formalism is used to analyse high-resolution X-ray diffraction data, obtained for an InSb/InGaSb/InSb/InAs superlattice grown on top of a GaSb buffer layer on a (001) GaSb substrate.

Keywords: X-ray dynamical diffraction theory; distorted crystals; epitaxic layers; films; multilayer semiconductor.