Journal of Applied Crystallography

Volume 39, Part 5 (October 2006)

laboratory notes

J. Appl. Cryst. (2006). 39, 767-770 [ doi:10.1107/S0021889806023144 ]

Energy spectrometer on a diffractometer using a charge-coupled device X-ray detector

H. Abe, H. Saitoh, H. Nakao, K. Ito and K. Ohshima

Abstract: A charge-coupled device (CCD) X-ray detector for inelastic X-ray scattering was installed at beamline BL-4C of the Photon Factory at the High Energy Accelerator Research Organization in Japan. A wavelength-dispersive X-ray spectrometer was mounted on a six-circle diffractometer. Energy spectra were obtained by the CCD X-ray detector and a curved highly oriented pyrolytic graphite analyser. By the combination of energy spectroscopy and diffraction, simultaneous real-time data acquisition of both the momentum and the energy transfer was performed.

Keywords: wavelength-dispersive X-ray spectroscopy; charge-coupled device detector.