Journal of Applied Crystallography

Volume 39, Part 3 (June 2006)

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J. Appl. Cryst. (2006). 39, 468    [ doi:10.1107/S0021889806010806 ]

A Crystallographic Information File for specular reflectivity data

A. van der Lee and I. D. Brown

Keywords: CIF; specular reflectivity data.

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