Journal of Applied Crystallography

Volume 38, Part 4 (August 2005)

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J. Appl. Cryst. (2005). 38, 678-684    [ doi:10.1107/S0021889805019370 ]

Lattice-constant and stress measurement in single crystals: a new method

B. Ortner

Abstract: A method for the X-ray determination of lattice-plane distances is given. Similar to Bond's method, it is based on the measurement of rocking curves, with some advantages and disadvantages compared with the former method. The new method is especially designed for single-crystal stress measurement. Its usefulness is demonstrated in two examples of lattice-constant and stress measurement.

Keywords: lattice plane; stress analysis; lattice parameters.

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