J. Appl. Cryst. (2004). 37, 703-710 [ doi:10.1107/S0021889804012956 ]
Abstract: Multilamellar phases can be identified and characterized by small-angle scattering of X-rays (SAXS) or neutrons (SANS). Equidistant peaks are the typical signature and their spacing allows the fast determination of the repeat distance, i.e. the mean distance between the midplane of neighbouring bilayers. The scattering function can be described as the product of a structure factor and a form factor. The structure factor is related to the ordering of the bilayers and is responsible for the typical equidistant peaks, but it also contains information about the bilayer flexibility and the number of coherently scattering bilayers. The form factor depends on the thickness and the internal structure (scattering length density distribution) of a single bilayer. The recently developed generalized indirect Fourier transformation (GIFT) method is extended to such systems. This method allows the simultaneous determination of the structure factor and the form factor of the system, including the correction of instrumental broadening effects. A few-parameter model is used for the structure factor, while the determination of the form factor is completely model-free. The method has been tested successfully with simulated scattering data and by application to experimental data sets.
Keywords: small-angle scattering; lamellar phases; form factor; structure factor; generalized indirect Fourier transformation; layer structures.
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