Journal of Applied Crystallography

Volume 37, Part 4 (August 2004)

research papers

J. Appl. Cryst. (2004). 37, 575-584 [ doi:10.1107/S0021889804011288 ]

SAXS of self-assembled oriented lamellar nanocomposite films: an advanced method of evaluation

W. Ruland and B. Smarsly

Abstract: Oriented lamellar nanocomposites formed of alternating organic and inorganic layers were prepared by evaporation-induced self-assembly and studied by small-angle X-ray scattering in symmetrical and asymmetrical reflection. Analytical expressions were used for a quantitative fit of the experimental data. The fitting procedure leads to a comprehensive characterization of the lamellar two-phase system in terms of the average thicknesses of the lamellae, the average period and the corresponding variances, using both the stacking model and the lattice model. Furthermore, the width of the domain boundary and the preferred orientation were determined. No significant differences could be found between the parameters obtained for the two models, but the lattice model leads to a better curve fitting. The effects of finite stack height and of instrumental broadening were found to be indistinguishable.

Keywords: small-angle X-ray scattering; oriented lamellar nanocomposites; layer structures; thin films.