Journal of Applied Crystallography

Volume 35, Part 5 (October 2002)

research papers

J. Appl. Cryst. (2002). 35, 589-593 [ doi:10.1107/S0021889802010695 ]

Analysis of asymmetric broadening of X-ray diffraction peak profiles caused by randomly distributed polarized dislocation dipoles and dislocation walls

I. Groma and G. Monnet

Abstract: The problem of asymmetric X-ray diffraction peak broadening caused by dislocations is investigated. The leading term responsible for the asymmetry of the intensity distribution is calculated for randomly distributed polarized dipoles and dipole walls. It is found that the polarization structure of a dislocation ensemble can be determined from the diffraction order dependence of the profile asymmetry.

Keywords: X-ray diffraction; dislocation microstructure; asymmetric peak broadening.