Journal of Applied Crystallography

Volume 35, Part 2 (April 2002)

short communications

J. Appl. Cryst. (2002). 35, 267-269 [ doi:10.1107/S0021889801021203 ]

On the intrinsic hook effect associated with pseudo-Voigt profiles

P. Dasgupta

Abstract: An intrinsic hook effect was always found to be associated with pseudo-Voigt (p-V) profiles when [eta] was less than 0.328 and the FWHM was small (0.02°), where [eta] is the fraction of the Cauchy component and FWHM is the full width at half-maximum. The applicability of the Warren-Averbach (WA) analysis for the case of p-V profiles was thoroughly studied and it was found that a p-V profile with [eta] values ranging from 0 to 1 can be safely subjected to WA analysis, provided that the FWHM of the profile is large enough (2w [asymptotically equal to] 0.378°).

Keywords: profile analysis; Warren-Averbach analysis; pseudo-Voigt profile.