Journal of Applied Crystallography

Volume 34, Part 2 (April 2001)

research papers

J. Appl. Cryst. (2001). 34, 157-165 [ doi:10.1107/S0021889801001352 ]

Kinematical two-dimensional multiple-diffraction intensity profiles. Application to - scans of silicon and diamond obtained with synchrotron radiation

E. Rossmanith, A. Hupe, R. Kurtz, H. Schmidt and H.-G. Krane

Abstract: In a previous paper by Rossmanith [J. Appl. Cryst. (2000), 33, 1405-1414], expressions for the calculation of multiple-diffraction patterns observed in [omega] - [psi] scans of Bragg reflections were derived within the framework of the kinematical theory, taking into account the divergence and wavelength spread of the incident beam, as well as the mosaic structure of the crystal sample. Agreement with Cu K [alpha] experiments was demonstrated. In this paper, it is shown that the theoretical expressions are also suitable for synchrotron radiation experiments.

Keywords: multiple diffraction; kinematical theory; - scans.