Journal of Applied Crystallography

Volume 34, Part 1 (February 2001)

addenda and errata


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J. Appl. Cryst. (2001). 34, 87    [ doi:10.1107/S0021889800020203 ]

A new version of the method for analysing peak broadening caused by local tilt distribution in double-crystal X-ray diffraction measurements. Erratum

K. Nakashima

Abstract: As a result of a printer's error, Fig. 9 of the paper by Nakashima [J. Appl. Cryst. (2000), 33, 1376-1385] was incorrectly printed. The correct figure is given here.

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