Journal of Applied Crystallography

Volume 34, Part 1 (February 2001)

research papers

 

Anisotropic strain in YBa₂Cu₃O_7- films analysed by deconvolution of two-dimensional intensity data

J. Brötz and H. Fuess

Abstract: The influence of the instrumental resolution on two-dimensional reflection profiles of epitaxic YBa₂Cu₃O_7- films on SrTiO₃ (001) has been studied in order to investigate the strain in the superconducting films. The X-ray diffraction intensity data were obtained by two-dimensional scans in reciprocal space (q-scan). Since the reflection broadening caused by the apparatus differs for each position in reciprocal space, a highly crystalline substrate was used as a standard. Thus it was possible to measure a standard very close to the YBa₂Cu₃O_7- reflections in reciprocal space. The two-dimensional deconvolution of reflections by a new computer program revealed an anisotropic strain of the two twinning systems of the film.

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