Automatic XAFS measurement system developed at BL14B2 in SPring-8

A novel automatic measurement system has been developed, in which the XAFS measurement of up to 80 samples in transmission and fluorescence modes can be carried out.

Several long-period crystal lattices formed by solid-state reaction in Bi-Mn double-layer films

Long-period tetragonal lattice formation by solid-state alloying at the interfaces of Bi-Mn double-layer thin films

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Automatic XAFS measurement system developed at BL14B2 in SPring-8

Several long-period crystal lattices formed by solid-state reaction in Bi-Mn double-layer films

Long-period tetragonal lattice formation by solid-state alloying at the interfaces of Bi-Mn double-layer thin films