Results 1 to 5 of 5, sorted by name.
Marianna Strumpel (Institut für Kristallographie der Freien Universität Berlin, Takustr. 6, Germany) General scientific interests: structure determination. Detailed scientific research interests: conformation, valence charge density, vector search. | ||||
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Masood Parvez (2500 University Dr., NW, Dept of ChemistryU. of Calgary , Canada, Canada) Detailed scientific research interests: antiallergic drugs, valence charge density, X-ray crystallography of organic,inorganic and organometallic compounds. | ||||
Search for papers by Parvez, M. in Crystallography Journals Online | Google Scholar | Pubmed |
![]() | Ullrich Pietsch (Fachbereich 7 - Festkörperphysik, Universität Siegen, Walter Flex Str. 2 Postfach 601553 , Germany) General scientific interests: charge density, diffuse scattering, dynamical diffraction, Laue diffraction, X-ray diffraction. Detailed scientific research interests: instrumentation, multilayer, nanostructures, semiconductor compounds, valence charge density, X-ray diffractometry, X-ray reflectometry. | |||
Search for papers by Pietsch, U. in Crystallography Journals Online | Google Scholar | Pubmed |
Fumihito Mohri (Electronics Laboratory, KANEKA Corporation, Japan) General scientific interests: coordination chemistry, crystal chemistry, hydrogen bonding, inorganic compounds, oxides, polymers. Detailed scientific research interests: ab-initio calculations, bond length/bond strength relationships, bonding in solids, molecular-orbital calculations, valence electron density distribution, X-ray charge-density analysis. | ||||
Search for papers by Mohri, F in Crystallography Journals Online | Google Scholar | Pubmed |
Hiroki Okudera (Course in Earth and Planetary Science, School of Geosciences and Civil Engineering, Kanazawa University, Japan) General scientific interests: inorganic compounds, Rietveld method, X-ray diffraction. Detailed scientific research interests: eliminating multiple-diffraction effect on electron density maps, forming photocatalytic transparent thin film on any substrate, mixed-valence compounds, observing density of electrons which take part in charge transfer phenomenon,, relationship between distance and bonding character of cation and anion. | ||||
Search for papers by Okudera, H. in Crystallography Journals Online | Google Scholar | Pubmed |