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Results 1 to 10 of 11, sorted by name.

Dr Natalia N. Novikova   Natalia N. Novikova (Institute of Crystallography, Lab. of X-ray Optics and Synchrotron Radiation, Russian Academy of Sciences, 59 Leninsky prosp., Russia, Russian Federation)
Detailed scientific research interests: thin film, X-ray and synchrotron radiation instrumentation, X-ray dynamical diffraction, X-ray standing wave.
Search for papers by Novikova, N.N. in Crystallography Journals Online | Google Scholar | Pubmed
Dr Atsushi Kohno   Atsushi Kohno (Department of Applied Physics, Fukuoka University, Japan)
General scientific interests: ferroelectrics, ferroic materials, materials science, semiconductors, small-angle scattering, synchrotron radiation, thin films, X-ray diffraction.
Detailed scientific research interests: ferroelectric thin film, GISAXS, nanostructured materials, Si supersaturated with impurity, silicon nanocrystal, thin-film growth, X-ray diffraction for thin films and nanostrucured materials, X-ray reflectivity analysis.
Search for papers by Kohno, A. in Crystallography Journals Online | Google Scholar | Pubmed
Professor Osamu Nittono   Osamu Nittono (Metallurgy and Ceramics, Tokyo Institute of Technology, Japan)
General scientific interests: dynamical diffraction, materials science, X-ray topography.
Detailed scientific research interests: diffraction technique, magnetic film, metallurgy, multilayered film, nano-structure, phase transformation, semiconductor, structural change, thin film, X-ray goniometry.
Search for papers by Nittono, O. in Crystallography Journals Online | Google Scholar | Pubmed
Dr Herbert E. Gobel   Herbert E. Göbel (Lab. Cryst. Analytics, Goldschaggbogen 11, Germany)
General scientific interests: catalysis, ceramics, crystal chemistry, databases, ferroelectrics, instrumentation, materials science, metals, oxides, powder diffraction, residual stress, Rietveld method, semiconductors, texture, thin films, time-resolved studies, X-ray diffraction, X-ray optics.
Detailed scientific research interests: double/triple-crystal diffraction, material characterization, methodology of diffraction analysis, reflectivity, thin film, X-ray powder diffraction.
Search for papers by Göbel, H.E. in Crystallography Journals Online | Google Scholar | Pubmed
Dr Stephen B. Robie   Stephen B. Robie (Evans Analytical Group, 810 Kifer Rd, USA)
General scientific interests: electron diffraction, epitaxy, materials science, phase determination, residual stress, semiconductors, texture, thin films, X-ray diffraction.
Detailed scientific research interests: grazing incidence diffraction, high resolution X-ray diffraction, orientation imaging microscopy, semiconductor materials, thin film characterization, total reflection X-ray fluorescence, X-ray fluorescence spectroscopy, X-ray reflectivity.
Search for papers by Robie, S.B. in Crystallography Journals Online | Google Scholar | Pubmed
Professor Dr Noriaki Nakayama   Noriaki Nakayama (Department of Applied Chemistry, Yamaguchi University, Japan)
General scientific interests: electron diffraction, electron microscopy, incommensurate phases, inorganic compounds, materials science, modulated structures, oxides, phase transitions, powder diffraction, silicates, X-ray diffraction, zeolites.
Detailed scientific research interests: manganese compounds, metallic multilayers, microporous materials, mixed cobalt oxides, modulated structure, Powder X-ray Diffraction, superlattice structure, TEM characterization, thin film x-ray diffraction.
Search for papers by Nakayama, N. in Crystallography Journals Online | Google Scholar | Pubmed
Dr Matej Jergel   Matej Jergel (Department of Multilayers and Nanostructures, Institute of Physics of the Slovak Academy of Sciences, Slovakia (Slovak Republic))
General scientific interests: materials science, small-angle scattering, surfaces, synchrotron radiation, thin films, X-ray diffraction, X-ray optics.
Detailed scientific research interests: grazing incidence small-angle X-ray scattering, grazing incidence X-ray diffraction, nanoparticle assemblies, planar and patterned multilayers, thin film nanostructures, X-ray specular and non-specular reflectometry.
Search for papers by Jergel, M. in Crystallography Journals Online | Google Scholar | Pubmed
Professor Massimo Moret   Massimo Moret (Dipartimento di Scienza dei Materiali, Università di Milano-Bicocca, Italy)
General scientific interests: chemical crystallography, crystal engineering, crystal growth, epitaxy, materials science.
Detailed scientific research interests: crystallographic education, organic molecular crystals, organic thin-film epitaxy, scanning probe microscopy, single-crystal growth, X-ray diffraction.
Search for papers by Moret, M. in Crystallography Journals Online | Google Scholar | Pubmed
Michal Kolega   Michal Kolega (X-ray Laboratory, Inst. of Technology and Reliability, West Bohemia U., Veleslavínova 11, Plzeň, 301 04, Czech Republic)
Detailed scientific research interests: amorphization, coating, diffraction, lattice distortion, line broadening, nitride, paracrystal, profile analysis, PVD, strain, thin film, X-ray fluorescence spectroscopy.
Search for papers by Kolega, M. in Crystallography Journals Online | Google Scholar | Pubmed

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