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Results 1 to 10 of 307, sorted by name.
| Victoria Jarvis (Chemistry and Chemical Biology, McMaster University, Canada) General scientific interests: materials science, powder diffraction, residual stress, texture, X-ray diffraction. Detailed scientific research interests: texture analysis, two-dimensional diffraction two-dimensional XRD instrumentation texture, X-ray difraction techniques, polycrystalline texture. | ||||
| Search for papers by Jarvis, V. in Crystallography Journals Online | Google Scholar | Pubmed | ||||
 | Zofia Kania (Institute for Ferrous Metallurgy, Karol Miarki, Poland) General scientific interests: powder diffraction, texture, X-ray diffraction. Detailed scientific research interests: X-ray diffraction, qualitative identification, texture studies,. | |||
| Search for papers by Kania, Z in Crystallography Journals Online | Google Scholar | Pubmed | ||||
| Constanza Patricia Buioli (Laboratorio de Materiales y Fabricación de Aleaciones Especiales, Comisión Nacional de Energía Atómica, Argentina) General scientific interests: alloys, materials science, physical crystallography, texture, X-ray diffraction. Detailed scientific research interests: Crystalline texture in Zr based alloys tubes.. | ||||
| Search for papers by Buioli, CP in Crystallography Journals Online | Google Scholar | Pubmed | ||||
 | Paul Van Houtte (MTM, Katholieke Universiteit Leuven, Belgium) General scientific interests: materials science, metals, residual stress, texture. Detailed scientific research interests: aluminium, anisotropy, composite materials, crystal plasticity, crystallographic texture, plastic deformation, plasticity, residual stress, steel. | |||
| Search for papers by Van Houtte, P. in Crystallography Journals Online | Google Scholar | Pubmed | ||||
 | Husin SITEPU (Research and Development Center, Saudi Aramco, Saudi Arabia) General scientific interests: powder diffraction, Rietveld method, synchrotron radiation, texture, zeolites. Detailed scientific research interests: Structural and Texture refinement of deposits Rietveld Method, Structural refinement of zeolite catalysts by Rietveld Method. | |||
| Search for papers by SITEPU, H in Crystallography Journals Online | Google Scholar | Pubmed | ||||
| Xiaodong Wang (Central Analytical Research Facility, Queensland University of Technology, Australia) General scientific interests: instrumentation, residual stress, Rietveld method, texture, thin films. Detailed scientific research interests: Line Profile Analysis, Quantitative Phase Analysis, residual stress, Stacking fault, texture, thin films. | ||||
| Search for papers by Wang, X. in Crystallography Journals Online | Google Scholar | Pubmed | ||||
| Ayman Salem (Universal Technology Corp., 1270 N Fairfield Rd., USA) General scientific interests: electron diffraction, electron microscopy, materials science, metals, teaching and education, texture, twinning, X-ray diffraction. Detailed scientific research interests: twinning, strain hardening, titanium, EBSD, X-ray diffraction, texture. | ||||
| Search for papers by Salem, A in Crystallography Journals Online | Google Scholar | Pubmed | ||||
 | Slawomir Kolodziej (Institute Of Engineering Materials And Biomaterials, Silesian University of Technology, Poland) General scientific interests: cryocrystallography, materials science, metals, structure determination, texture, twinning, X-ray diffraction. Detailed scientific research interests: high manganese steels, TRIP/TWIP effect, X-Ray analysis, deformation texture. | |||
| Search for papers by Kolodziej, S. in Crystallography Journals Online | Google Scholar | Pubmed | ||||
| Laurent Barrallier (MSMP Lab., ENSAM, France) General scientific interests: neutron scattering, phase transitions, residual stress, texture, X-ray diffraction. Detailed scientific research interests: heterogeneous material mechanic, neutron diffraction, nitriding, profile analysis, shot peening, synchrotron, texture. | ||||
| Search for papers by Barrallier, L. in Crystallography Journals Online | Google Scholar | Pubmed | ||||
 | Francisco Cruz Gandarilla (Dpto. Fisica. Escuela Superior de Fisica y Matematicas, Instituto Politecnico Nacional., Mexico) General scientific interests: alloys, electron diffraction, electron microscopy, instrumentation, materials science, metals, powder diffraction, residual stress, Rietveld method, surfaces, texture, thin films, X-ray diffraction. Detailed scientific research interests: Texture and Anysotropic Properties of Materials.Texutre Techniques XRD and EBSD.. | |||
| Search for papers by Cruz Gandarilla, F. in Crystallography Journals Online | Google Scholar | Pubmed | ||||