Results 1 to 5 of 5, sorted by name.
Frans A. J. Peerdeman (Commercial Department, Philips Analytical, Netherlands) General scientific interests: catalysis, instrumentation, phase transitions, X-ray diffraction, X-ray optics. Detailed scientific research interests: size strain analysis, stress. | ||||
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Tamás Ungár (Materials Physics Department , Eötvös University Budapest, Hungary) General scientific interests: alloys, defects, materials science, metals, powder diffraction, residual stress, X-ray diffraction. Detailed scientific research interests: dislocations, line profile analysis, microstructure, real structure, size and strain, size distribution. | ||||
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![]() | Robert Delhez (Materials Science and Engineering, Delft University of Technology, Netherlands) General scientific interests: defects, instrumentation, materials science, powder diffraction, X-ray diffraction. Detailed scientific research interests: line profile analysis / size-strain analysis; handheld X-ray diffractometers. | |||
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David Rafaja (Institute of Materials Science, Technical Unversity Bergakademie Freiberg, Germany) General scientific interests: defects, materials science, Rietveld method, thin films, X-ray diffraction. Detailed scientific research interests: electron microscopy, low-dimensional materials, nanocrystalline materials, real structure analysis, size strain analysis, X-ray diffraction, X-ray scattering. | ||||
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Vladimir Sepelak (Nanostructured Materials, Karlsruhe Institute of Technology, Germany) General scientific interests: ceramics, disorder, inorganic compounds, Rietveld method, X-ray diffraction. Detailed scientific research interests: high-energy milling, mechanically-induced disorder, mechanochemistry, metastable material, Mössbauer spectroscopy, nanocrystal, nanomagnetism, size-strain analysis, spinel ferrite, structure-property relationship, thermal stability. | ||||
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